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Fig. 7 | Heritage Science

Fig. 7

From: Detecting iron-based pigments on ruthenium-coated ancestral Pueblo pottery using variable pressure scanning electron microscopy

Fig. 7

Micro-XRF-SEM map showing areas of the sherd containing iron, aluminum, potassium, calcium, sulfur, and silicon. Tabs of carbon tape (arrows) added to locate areas of sample. A Hitachi S-3400 N SEM equipped with an X-ray source (IXRF Systems 10 μm X-beam Micro-XRF using an X-ray source monocapillary optic Rh tube operating at 50 kV and 1000 μA) and an IXRF Systems (30 mm) EDS detector was used to produce the Micro-XRF-SEM elemental maps Scale 5 mm

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