Fig. 1From: Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper(Top) a photograph of the view from the painting of the XRF and FORS point measurement collection head showing the X-ray source, X-ray detector and fiber optic reflectance sensor and light source. (Bottom) a photograph showing the painting on the computer controlled easel along with the diffuse white standard and the XRF and FORS instrumentsBack to article page