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Table 1 Detection parameters

From: Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper

Mode

Spectral range

Spectral sampling

Spectral response FWHM

Spatial sampling diameter (mm)

XRF and FORS integration times (s)

XRF only integration times (s)

Reflectance

350–2500 nm

1.4, 350–1050 nm

3 @ 700 nm

3–5

1

NA

2, 1000–2500 nm

10 @ 1400 nm

XRF

1.6–25 keV

13.7 eV/channel

165 eV @ Mn K alpha

0.1–1

0.33

0.01–2