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Table 1 Comparison of different FT-IR approaches for analyzing textile fibers

From: Reflectance FT-IR spectroscopy as a viable option for textile fiber identification

Textile sample type/property

ATR-FT-IR spectrometer

ATR-FT-IR microspectrometer

r-FT-IR microspectrometer

Fragile sample

Applying pressure can damage the sample

High pressure should not be applied; spectrum quality might decrease

Applying pressure can cause damage, but since the sampling area is significantly smaller than regular ATR, the damage is very small

Non-contact approach

Enables analyzing the sample without any alteration

Thick sample

Penetration depth is few μm to few tens of μm

Fibers inside the fabric are not likely missed

Spectrum is recorded only from the surface

Fibers in the inner part of the thread might be missed

Uneven sample surface

Not a problem if enough pressure is applied, but high pressure may damage the sample

More difficult to get high-quality spectrum

Scattering from the surface is extensive

Extraneous material on sample fibers (additives or contaminants)

Penetration depth is few to few tens of μm [33]

Surface contamination can have influence on the spectrum

Spectrum is recorded only from the surface

Extraneous material on the surface can completely mask some fiber’s bands and show additional bands

Very small thread (less than 10 individual fibers)

Quality of the spectrum can be poor

Micro-ATR tip area of few μm diameter enables obtaining spectra from very small samples

Using MCT detector ensures good spectral quality

Spectrum may be distorted if the measured area (aperture) is larger than the sample thread itself