Fig. 2From: Characterization of the materials and techniques of a birthday inscribed lacquer plaque of the Qing DynastySEM and OM images of the surface layer and cross-sections of the inscribed plaque: a 600 × SEM secondary electron image of the surface layer. b 124 × SEM backscatter image of the cross-sections. c 200 × OM image of the cross-sections)Back to article page