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Table 2 Beam diameters in µm obtained using various materials with the sharp-edge method

From: Beam characterization of a microfading tester: evaluation of several methods

Material Direction of step FWHM w b z
Razor blade x 172.3 97.1 537.1 292.9
y 223.9 126.2 643.2 382.8
Teflon tape x 214.3 121.8 606.6 364.4
y 214.8 136.3 605.1 360.5
Silicon wafer x 153.6 86.6 459.5 261.3
y 209.3 117.9 1054.7 348.2
Muscovite x 205.1 115.6 607.4 350.4
y 228.5 128.8 612.6 281.9