Fig. 8

Microphotograph images using optical microscope, SEM and EDS analytical spots for exfoliated black and cyan pigment samples in this study. A, B Occurrences under stereoscopic microscope at the analysis point. C SEM secondary electron image in Fig. 3A. D SEM Back scattered electron image of Fig. 3A. E Elemental mapping image using EDS analysis on the black and cyan layer. F SEM secondary electronic images of carbon particles in Fig. 3A. G Enlarged particle image of Fig. 3F. H SEM secondary electron image in Fig. 3B