Fig. 10From: Possible modifications of parchment during ion beam analysisDigital 3D image (a) and depth profile (b, c) for a parchment area subjected to 1 µC/cm2 proton fluence at 250 pA, and immersed in 3% H2O2 solution for 5 min. The image was taken at the border of the non-irradiated and irradiated areas at one side of the irradiation spotBack to article page