Figure 1
From: XEOM 1 - A novel microscopy system for the chemical imaging of heritage metal surfaces
The data structure for x-ray excited optical luminescence microscopy. The energy of the broad incoming x-ray beam is stepped across an absorption edge of the chemical element under investigation in, typically 100 or more small increments. An optical luminescence image is acquired for each energy in the scan. The images form a stack which can be processed with suitable software to extract XEOL-XANES data from a column of single pixels (grey delineation and spectrum) or from user-defined regions of interest (RoI) (red and blue delineation and spectra). The power density in the x-ray beam is < 7.2 × 10-3 W mm-2.